Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation

Journal

IEEE Transactions on Very Large Scale Integration Systems

Vol

vol. 25, no. 6

Page

pp. 1821 - 1830

Author

Jaehyun Seo, Sangheon Lee, Kwangmin Kim, Sooeun Lee, Hyunsang Hwang and Byungsub Kim

Year

2017

Date

June

File

Automatic_ReRAM_SPICE_Model_Generation_From_Empirical_Data_for_Fast_ReRAM-Circuit_Coevaluation.pdf (3.3M) 21회 다운로드 DATE : 2022-04-30 00:01:40

Link

https://ieeexplore.ieee.org/document/7840076 499회 연결