Investigation on the Worst Read Scenario of a ReRAM Crossbar Array
- Journal
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Vol
- vol. 25, no. 9
- Page
- pp. 2402 - 2410
- Year
- 2017
- File
- Investigation_on_the_Worst_Read_Scenario_of_a_ReRAM_Crossbar_Array.pdf (2.4M) 8회 다운로드 DATE : 2022-04-30 00:23:30
POSTECH-Samsung Electronics ReRAM Cluster Research Project,
Ministry of Science, ICT and Future Planning, South Korea, through the ICT Consilience Creative Program (IITP-R0346-16-1007),
Institute of Information and Communications Technology Promotion (IITP) as well as National Research Foundation of Korea under Grant 2015R1A2A2A09001553