Cost-Efficient and Automatic Large Volume Data Acquisition Method for On-Chip Random Process Variation Measurement

Journal

IEIE Journal of Semiconductor Technology and Science

Vol

vol. 15, no.2

Page

pp. 184-193

Author

Sooeun Lee, Seungho Han, Ikho Lee, Jae-Yoon Sim, Hong-June Park and Byungsub Kim

Year

2015

Date

April

File

Cost-Efficient and Automatic Large Volume Data Acquisition Method for On-Chip Random Process Variation Measurement.pdf (3.5M) 1회 다운로드 DATE : 2022-04-30 01:01:20

Link

http://www.koreascience.or.kr/article/JAKO201514039404550.page 184회 연결