Publication

POSTECH BEVIL LAB

Selected Journals

Review on Resistive Termination Techniques Driven by Wireline Channel Behaviors
Journal
IEEE Open Journal of the Solid-State Circuits Society
Author
Changjae Moon; Minsoo Choi; Myungguk Lee; Byungsub Kim
Year
2024

This work was supported by Institute of Information & communications Technology Planning & Evaluation (IITP) grant funded by the Korea government (MSIT) (No. 2022-0-01171); 

[PIM] 60%



in part by Next-generation Intelligence semiconductor R&D Program through the NRF funded by the MSIT (RS-2023-00258227); 

[CIM] 40%



in part by the BK21 FOUR Project of NRF for the Dept. of EE, POSTECH; 

[BK21] 0%



in part by Samsung Electronics Co., Ltd (Cluster Academia Collaboration Program);

[삼성클러스터DT]



and in part by Samsung Electronics Co., Ltd (IO201211-08055-01).

[삼성PSEP]