Review on Resistive Termination Techniques Driven by Wireline Channel Behaviors
- Journal
- IEEE Open Journal of the Solid-State Circuits Society
- Year
- 2024
This work was supported by Institute of Information & communications Technology Planning & Evaluation (IITP) grant funded by the Korea government (MSIT) (No. 2022-0-01171);
[PIM] 60%
in part by Next-generation Intelligence semiconductor R&D Program through the NRF funded by the MSIT (RS-2023-00258227);
[CIM] 40%
in part by the BK21 FOUR Project of NRF for the Dept. of EE, POSTECH;
[BK21] 0%
in part by Samsung Electronics Co., Ltd (Cluster Academia Collaboration Program);
[삼성클러스터DT]
and in part by Samsung Electronics Co., Ltd (IO201211-08055-01).
[삼성PSEP]