Fast-Prototyping of Readout Circuits for FeFET-based Neuromorphic CIM Macro with Measurement-Driven Device Model Generator and Readout Layout Automation
- Journal
- IEEE Access
- Page
- 1-17
- Year
- 2026
The National Research Foundation (NRF) funded by Korean Government (MSIT) under Grant RS-2026-25539124 (50%)
The Institute of Information and Communications Technology Planning and Evaluation (IITP) grant funded by Korean Government (MSIT) through the Development of Semiconductor Design Technology Based on Open Source for PIM Semiconductor Design under Grant RS-2025-02218027 (20%)
Korea Collaborative & High-Tech Initiative for Prospective Semiconductor Research (K-CHIPS) funded by the Ministry of Trade, Industry & Energy (MOTIE), South Korea, under Grant RS-2026-25521395 (20%)
Korea Institute for Advancement of Technology (KIAT) grant funded by Korea Government (MOTIE) through the HRD Program for Industrial Innovation under Grant RS-2024-00401466 (10%)
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BK21 FOUR Project of NRF for the Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH)
Samsung Electronics Company Ltd., under Grant IO250917-13624-01.
Samsung Electronics Company Ltd., under Grant IO251222-14919-01.