A Coefficient-Error-Robust FFE Tx with 230% Eye Variation Improvement without Calibration in 65-nm CMOS Technology
- Year
- 2014
- Author
- Seungho Han
- Co-author
- Sooeun Lee, Minsoo Choi, Jae-Yoon Sim, Hong-June Park and Byungsub Kim
- Conference
- 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)
- File
- 2.7_A_coefficient-error-robust_FFE_TX_with_230_eye-variation_improvement_without_calibration_in_65nm_CMOS_technology.pdf (2.2M) 8회 다운로드 DATE : 2022-05-01 16:41:32
National Research Foundation (NRF) of Korea grant (No. 2012R1A2A2A02010432) funded by the Korean Ministry of Education, Science and Technology (MEST),
EDA tool support by IDEC.
15th Korean Solid-State Circuit Design Contest Gold Award: Prime Ministry Award, Oct. 21, 2014